# Surface Science Cluster

FlexPES HR ARPES instrument, which was produce by SPECS Surface Nano Analysis GmbH, is devoted to the high angular- and energy-resolution electronic structure studies of different objects which must be in the monocrystalline or polycrystalline form. (Powder and wet samples are generally not possible; some special samples can be discussed case-by-case.) This instrument was installed in our group in January 2021 and is in full operation since October 2021. We also provide access to this instrument to different users under conditions which are placed below.

This XPS/ARPES instrument consists of two chambers, preparation and analysis, and load-lock for sample loading. Main components are:

• Energy analyzer: SPECS PHOIBOS 150 with 2D-CMOS detector
• Monochromatized UV source: UVS 300 with TMM 304
• Sample handling in the analysis chamber: Motorized 5-axis manipulator Ganymed with temperature range 7 K – 300 K
• Monochromatic x-ray source: FOCUS 500/600 with two lines (Al K$\alpha$, 1486.6eV and Ag L$\alpha$, 2984.3 eV)
• Ion source for sample preparation: IQE 11/35, ion energy range 0 eV – 3000 eV
• Sample morphology characterization: ErLEED 100 with ErLEED 1000-A power supply
• Sample handling in the preparation chamber: Motorized 4-axis manipulator with temperature range 100 K – 1200 K
• Sample heating in the preparation chamber: high temperature heating stage with temperatures up to 2300 K
• Thin films preparation: a series of e-beam evaporators (commercial EBE-1 and home-made)

The access to this instrument inside Shanghai University and for external users is provided only under the full control performed by members of the group lead by Prof. Yuriy Dedkov and Prof. Elena Voloshina.