FlexPES HR ARPES instrument, which was produce by SPECS Surface Nano Analysis GmbH, is devoted to the high angular- and energy-resolution electronic structure studies of different objects which must be in the monocrystalline or polycrystalline form. (Powder and wet samples are generally not possible; some special samples can be discussed case-by-case.) This instrument was installed in our group in January 2021 and is in full operation since October 2021. We also provide access to this instrument to different users under conditions which are placed below.
This XPS/ARPES instrument consists of two chambers, preparation and analysis, and load-lock for sample loading. Main components are:
- Energy analyzer: SPECS PHOIBOS 150 with 2D-CMOS detector
- Monochromatized UV source: UVS 300 with TMM 304
- Sample handling in the analysis chamber: Motorized 5-axis manipulator Ganymed with temperature range 7 K – 300 K
- Monochromatic x-ray source: FOCUS 500/600 with two lines (Al K\alpha, 1486.6eV and Ag L\alpha, 2984.3 eV)
- Ion source for sample preparation: IQE 11/35, ion energy range 0 eV – 3000 eV
- Sample morphology characterization: ErLEED 100 with ErLEED 1000-A power supply
- Sample handling in the preparation chamber: Motorized 4-axis manipulator with temperature range 100 K – 1200 K
- Sample heating in the preparation chamber: high temperature heating stage with temperatures up to 2300 K
- Thin films preparation: a series of e-beam evaporators (commercial EBE-1 and home-made)
The access to this instrument inside Shanghai University and for external users is provided only under the full control performed by members of the group lead by Prof. Yuriy Dedkov and Prof. Elena Voloshina.
The main rules for access to this instrument are the following:
- Please fill this form and send your request for the experiment directly to e-mails stated in the form. Only requests which are sent by e-mail will be considered (other communication channels will not be considered and will be ignored). This rule is introduced with the aim of making proper planning and careful documentation of all experiments.
- Please provide info – how urgent and important are your measurements. This will allow us to carefully select the respective time in our work
- After receiving all information, you will be notified within one week (or shorter) about available slots for experiments
- Our group can provide not more than 20-25% of our working time for experiments on the samples from other experimental groups
- The prices for the access to FlexPES HR ARPES instrument are specified below
| No. | Method | Kind of measurement | Price | Notes |
|---|---|---|---|---|
| 1 | XPS | Survey spectrum (∆E = 0.5 eV) | 1000 RMB/hour | For SHU (minimal time set: 2 hours) |
| 2 | XPS | Detailed spectra of core levels (∆E is defined by request) | 2000 RMB/hour | For SHU (minimal time set: 2 hours) |
| 3 | XPS | Detailed spectrum of valence band (∆E is defined by request) | 2000 RMB/hour | For SHU (minimal time set: 2 hours) |
| 4 | XPS | XPS mapping (parameters are defined by request) | 2000 RMB/hour | For SHU (minimal time set: 4 hours) |
| 5 | UPS | Detailed spectrum of valence band (∆E is defined by request) | 2000 RMB/hour | For SHU (minimal time set: 2 hours) |
| 6 | ARPES | Valence band angular mapping (∆E, angular resolution, scanning range of energy and angles are defined by request); Motorised polar angle scan | 4000 RMB/hour | For SHU (minimal time set: 4 hours) |
| 7 | ARPES | Valence band angular mapping (∆E, angular resolution, scanning range of energy and angles are defined by request); Electrostatic deflector lenses scan | 4000 RMB/hour | For SHU (minimal time set: 4 hours) |
| 8 | LEED | Sample preparation and measurements | 500 RMB per single energy | For SHU (minimal set: 2 energy points) |
| 9 | Sample treatment | Single- and poly-crystals preparations in UHV conditions (energy of Ar beam and annealing temperatures are specified by request) | 500 RMB/hour | For SHU (minimal time: 1 hour) |
Comments:
- for external requests the factor of 1.5 is applied
- if additional samples preparations’ routines will be required during experiments, then price is calculated accordingly
- for low-temperature XPS, UPS, ARPES experiments the price for measurements will be increased and discussed before every experiment set